Atomic Force Microscopy (AFM)
Atomic Force Microscopy (AFM) is a powerful imaging technique used to visualize and measure surfaces at the nanoscale, which is a billionth of a meter. It works by scanning a tiny, sharp probe very close to a sample's surface. As the probe encounters various features, it detects forces between the probe and the surface, which creates a detailed image. AFM can reveal structures and properties of materials, making it valuable in fields like materials science, biology, and nanotechnology, helping researchers study everything from cells to new materials at incredibly small scales.
Additional Insights
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Atomic force microscopy (AFM) is a powerful imaging technique used to visualize surfaces at the nanoscale, which is a billionth of a meter. It works by scanning a sharp tip attached to a tiny cantilever across the surface of a sample. As the tip moves close to the surface, it interacts with the atoms, causing the cantilever to bend. This bending is measured, allowing researchers to create detailed topographical images of the sample. AFM is widely used in materials science, biology, and nanotechnology to investigate properties such as shape, roughness, and mechanical strength at an atomic level.
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Atomic force microscopy (AFM) is a technique used to measure and visualize surfaces at the nanoscale, which is much smaller than what traditional microscopes can see. It works by moving a tiny probe across a surface, feeling the forces between the probe and the atoms on the surface. This allows scientists to create detailed 3D images of materials and observe their properties, like texture and stiffness. AFM is widely used in fields such as biology, materials science, and nanotechnology to study structures at the atomic level, aiding in research and development of new materials.