Tip-Enhanced Near-field Optical Microscopy (TENOM)

Tip-Enhanced Near-field Optical Microscopy (TENOM) is an advanced imaging technique that combines traditional optical microscopy with the use of a finely pointed tip, similar to a tiny needle. This tip enhances the light signals from very small areas, allowing scientists to observe and study materials at the nanoscale, much smaller than what conventional microscopes can achieve. TENOM enables researchers to visualize the properties of materials with high resolution, aiding in fields such as materials science and biology by providing detailed information about their structure and behavior at the molecular level.