Tip-Enhanced Near-field Optical Microscopy

Tip-Enhanced Near-field Optical Microscopy (TENOM) is an advanced imaging technique that combines a tiny, sharp probe with light to see extremely small details at the nanoscale. When the probe is very close to a sample, it amplifies the light’s interaction with the surface, allowing scientists to visualize structures much finer than traditional microscopes. This method enhances optical signals locally, providing high-resolution images of materials’ textures, compositions, or molecular arrangements. TENOM is useful for studying biological, electronic, or nanomaterial surfaces with exceptional detail, advancing research in fields like nanotechnology and material science.