tip-sample interaction

Tip-sample interaction refers to the way a tiny probe (tip) interacts with a surface (sample) during microscopic analysis, such as in Atomic Force Microscopy (AFM). The tip, often just a few atoms wide, feels forces from the surface like attraction, repulsion, or friction. These interactions reveal detailed information about the surface’s structure, texture, or properties. Essentially, the tip acts like a very sensitive finger that "senses" the surface at a nanoscale level, allowing scientists to create detailed images and measurements of surfaces that are too small to see with ordinary microscopes.