Atomic Force Microscope (AFM)

An Atomic Force Microscope (AFM) is a sophisticated tool used to image and measure surfaces at the nanoscale, which is one billionth of a meter. It works by scanning a tiny probe or tip across a surface, sensing the forces between the tip and the atoms on the surface. This allows scientists to create detailed, three-dimensional maps of materials at an incredibly small scale. AFM is valuable in fields like biology, materials science, and nanotechnology, helping researchers understand the properties and behaviors of various substances at the atomic level.