scanning probe microscopy
Scanning probe microscopy (SPM) is a technique used to image and study surfaces at the atomic or molecular level. It works by moving a sharp probe very close to the surface being examined. The probe detects forces between itself and the atoms on the surface, allowing researchers to create detailed images and explore properties like conductivity and mechanical strength. SPM can be used in various fields, including materials science, biology, and nanotechnology, enabling scientists to visualize structures and phenomena that are invisible to traditional microscopes.
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Scanning Probe Microscopy (SPM) is a technique used to study surfaces at the nanoscale. It involves scanning a sharp probe across a sample's surface to measure various properties, such as topography, electrical, or magnetic characteristics. As the probe moves, it interacts with the atoms, providing detailed images and information about the material's structure and features. This method is crucial in fields like materials science, biology, and nanotechnology, allowing researchers to visualize and manipulate structures at an incredibly small scale, often down to individual molecules.