SPM (Scanning Probe Microscopy)

Scanning Probe Microscopy (SPM) is a technique that uses a very sharp probe to scan the surface of a material at a microscopic scale. As the probe moves across the surface, it measures interactions like forces or electrical signals, creating detailed images of the surface's topography and properties. SPM allows scientists to observe structures at the nanometer level, revealing features invisible to traditional microscopes. This method is essential for studying materials, biological samples, and nanotechnology, providing insights into their structure, composition, and behavior at an extremely small scale.