scanning transmission electron microscopy

Scanning Transmission Electron Microscopy (STEM) is an advanced imaging technique used to examine materials at a very small scale, down to the atomic level. It combines features of both scanning and transmission electron microscopy. In STEM, a focused beam of electrons scans across a sample, producing high-resolution images and detailed information about its structure and composition. This technique is invaluable in fields like materials science and biology, helping researchers understand the properties of materials and biological specimens with great precision, revealing insights that are not possible with conventional light microscopy.