TEM (Transmission Electron Microscopy)

Transmission Electron Microscopy (TEM) is a powerful imaging technique that uses a beam of electrons to examine very thin samples at a microscopic level. Unlike traditional light microscopes, which use light to illuminate samples, TEM employs electrons, providing much higher resolution and allowing scientists to see structures at the atomic scale. By passing electrons through a sample and detecting those that transmit and scatter, TEM generates detailed images, revealing the internal organization and composition of materials, cells, and nanostructures. This technique is widely used in materials science, biology, and nanotechnology for research and analysis.