scanning nonlinear dielectric microscopy (SNDM)

Scanning nonlinear dielectric microscopy (SNDM) is a specialized imaging technique used to analyze materials at the nanoscale. It detects how materials respond to electric fields, revealing details about their electrical properties and structures. By scanning a sharp tip over a sample while applying a voltage, SNDM can generate high-resolution images that show variations in dielectric properties, which are important for understanding material behavior in electronics and other applications. This technique helps researchers explore complex materials, enhancing our knowledge in fields like nanotechnology and materials science.