scanning nonlinear dielectric microscopy

Scanning nonlinear dielectric microscopy (SNDM) is an advanced imaging technique that maps the electrical properties of a material’s surface at a microscopic level. It uses a tiny, specialized probe to apply and detect high-frequency electric signals, revealing how different regions respond nonlinearly—meaning their response changes with the applied signal’s strength. This helps scientists visualize variations in dielectric properties, such as polarization and conductivity, with very high resolution. SNDM is valuable for researching materials like semiconductors and ferroelectrics, providing detailed insights into their internal electrical behavior without destroying the sample.