SEM (Scanning Electron Microscopy)

Scanning Electron Microscopy (SEM) is a powerful imaging technique that uses focused beams of electrons to create detailed images of surfaces at a microscopic level. Unlike optical microscopes that use light, SEM can reveal textures and structures at a much higher resolution, often down to the nanometer scale. It works by scanning a specimen with electrons and detecting the signals produced, which helps to create a 3D-like image. SEM is widely used in materials science, biology, and engineering for analyzing structures, defects, and compositions in various samples.