Scanning Electron Microscope

A Scanning Electron Microscope (SEM) is an advanced tool that allows scientists to see tiny details of objects at very high magnifications, often up to a million times. Instead of using light like regular microscopes, SEMs use a beam of electrons that scans the surface of a sample. This produces detailed images showing the texture and structure of materials at a microscopic level. SEMs are widely used in fields like biology, materials science, and electronics to analyze surfaces, examine defects, or study the composition of samples with remarkable precision.