scanning electron microscope (SEM)

A scanning electron microscope (SEM) is an advanced scientific tool that uses focused beams of electrons to examine the surface of materials at a very high resolution, much greater than light microscopes. Instead of using light, the SEM scans the sample with electrons, which interact with the surface and produce detailed images. This technology reveals fine structural details and textures, allowing scientists to study materials in fields like biology, materials science, and electronics. The results provide valuable insights into the composition and morphology of samples, aiding in research and development across various disciplines.