secondary electron detector

A secondary electron detector is a device used in electron microscopy that captures secondary electrons emitted from a sample when it is bombarded with a primary beam of electrons. These secondary electrons carry information about the sample's surface features, like texture and topography. The detector collects these electrons and converts them into an image, allowing researchers to see fine details at a microscopic level. This technology is vital in fields such as materials science, biology, and nanotechnology, providing insights into the structure and composition of various materials.