Field Emission Gun SEM

A Field Emission Gun (FEG) in a Scanning Electron Microscope (SEM) is a specialized electron source that produces a very fine and stable beam of electrons by applying a strong electric field to a sharp tungsten or carbon tip. This allows for extremely high-resolution imaging of surfaces at the microscopic level. The FEG provides a bright, coherent electron beam, resulting in clearer images with greater detail and contrast. It's essential for advanced applications like materials research and nanotechnology, where precise surface characterization at the nanometer scale is required.