STEM (Scanning Transmission Electron Microscopy)

Scanning Transmission Electron Microscopy (STEM) is an advanced imaging technique that uses a focused beam of electrons to examine very small structures at high resolution. In STEM, a thin sample is scanned with electrons, which pass through or interact with it. Detectors capture the resulting signals to create detailed images and analyze composition at the atomic or nanoscale level. This method allows scientists to study materials’ structure, properties, and behaviors with exceptional clarity, crucial for fields like nanotechnology, materials science, and biology.