SEM (Scanning Electron Microscope)

A Scanning Electron Microscope (SEM) is a powerful tool used to examine the surface of objects at extremely high magnifications, often thousands of times larger than what a light microscope can achieve. It works by scanning a focused beam of electrons across a sample, which then emits signals that are converted into detailed images. SEM provides information about the sample's surface texture, composition, and structure, making it invaluable in fields like materials science, biology, and electronics for analyzing everything from tiny cells to advanced materials.