JEM Series (JEOL Electron Microscope Series)

The JEM Series from JEOL refers to a line of advanced electron microscopes designed for detailed imaging at the atomic and nanometer scale. These instruments use electron beams instead of light to examine tiny samples, providing exceptionally high-resolution images crucial for scientific and industrial research. The JEM Series includes various models tailored for different applications, such as materials science, biology, and electronics, allowing researchers to analyze structures, compositions, and defects with precision. Overall, they are powerful tools that enable scientists to see and understand the fundamental building blocks of matter.