electromigration

Electromigration is a phenomenon where the flow of electric current in a conductor, like a metal wire, causes the movement of atoms within the material. Over time, this movement can lead to the formation of tiny voids or bumps, damaging the conductor and impairing its ability to carry electricity. This is particularly a concern in microelectronics, where tiny circuits can fail due to electromigration, leading to device malfunctions. Understanding and managing electromigration is crucial in designing reliable electronic components that can withstand high currents over time.