computational electromigration

Computational electromigration is the study of how high electrical currents cause metal atoms within a material—like the tiny wires in electronic devices—to gradually move over time. Using computer simulations, scientists analyze how the flow of electrons exerts forces on these atoms, which can lead to material degradation or failure. This process helps in predicting and preventing issues such as circuit failures caused by metal fatigue, ensuring more reliable electronics. Essentially, it combines physics and computer modeling to understand and anticipate how electrical stresses impact materials at the microscopic level.