electromigration-induced voiding

Electromigration-induced voiding occurs when electrical current causes metal atoms in a conductor to gradually move, creating tiny empty spaces or voids. Over time, these voids can grow and merge, weakening the material and leading to failures such as circuit breaks. This process is driven by the momentum transfer from moving electrons to metal atoms, especially in tiny, densely packed circuits, which can cause the metal to effectively "drift" under the influence of electric current. Managing and preventing electromigration is crucial for ensuring the reliability and longevity of electronic devices.