scanning transmission electron microscopy (STEM)

Scanning Transmission Electron Microscopy (STEM) is an advanced imaging technique used to visualize the internal structure of materials at an atomic level. It combines features of both scanning electron microscopy and transmission electron microscopy. In STEM, a focused beam of electrons is scanned across a sample, allowing scientists to capture detailed images and gather information about the sample’s composition and properties. This technique is crucial in fields like materials science and nanotechnology, enabling researchers to understand the relationships between structure and function at very small scales, often down to individual atoms.