Aberration-Corrected STEM

Aberration-corrected Scanning Transmission Electron Microscopy (STEM) is an advanced imaging technique that uses powerful electron beams to see materials at extremely small scales, down to individual atoms. Aberrations are optical flaws that distort images; correction involves special lenses and technology to eliminate these distortions, resulting in clearer, sharper images. This allows scientists to precisely observe the arrangement of atoms within materials, enhancing our understanding of their properties and behaviors. In simple terms, aberration correction makes electron microscopes more accurate and detailed, opening new possibilities in nanotechnology, materials science, and biology.