High-Angle Annular Dark Field (HAADF)

High-Angle Annular Dark Field (HAADF) is an imaging technique used in electron microscopy to visualize tiny structures at the atomic level. It involves directing a beam of electrons through a sample and detecting those that scatter at high angles. Because heavier atoms scatter electrons more strongly, they appear brighter in the resulting image. This method provides high-resolution, compositional contrast images, allowing scientists to see detailed arrangements of atoms and differentiate elements within a material. HAADF is valuable for analyzing nanoscale materials and understanding their composition and structure.