Scanning Electron Microscopy (SEM)

Scanning Electron Microscopy (SEM) is a powerful imaging technique that uses electrons instead of light to create highly detailed pictures of surfaces at a microscopic level. In SEM, a beam of electrons scans the sample, and the interactions between the electrons and the sample produce signals that are converted into images. This allows scientists to observe the fine details of materials, including their shapes, textures, and compositions. SEM is widely used in various fields, such as materials science, biology, and electronics, to analyze the structure and properties of small objects and surfaces.