Debye-Scherrer Technique

The Debye-Scherrer technique is a method used to analyze the structure of crystalline materials. It involves shining X-rays onto a powdered sample, which causes the X-rays to diffract or scatter in specific patterns. By measuring the angles and intensity of the scattered X-rays, researchers can determine the arrangement of atoms in the crystal and identify the material. This technique is valuable in fields like materials science, chemistry, and geology, as it helps in understanding the properties of substances at the molecular level.