Conductive Scanning Probe Microscopy

Conductive Scanning Probe Microscopy (CSPM) is a technique used to visualize and analyze materials at the nanoscale. It employs a sharp probe that scans over a surface, measuring electrical conductivity changes. This allows scientists to create detailed images of the material's properties and structure. CSPM is particularly useful for studying semiconductors and biological samples where electrical characteristics are essential. By providing insight into how materials conduct electricity, CSPM aids in the development of new technologies in electronics and materials science.