Lateral Force Microscopy

Lateral Force Microscopy (LFM) is a technique used to study surface properties at a very small scale. It involves a tiny, sharp probe that slides across a sample’s surface. As it moves, the probe detects tiny frictional forces caused by the surface’s texture or composition. These forces reveal details about the surface’s mechanical characteristics, such as hardness, adhesion, or friction. LFM provides high-resolution images and measurements, helping scientists understand how materials behave at the microscopic level, which is valuable in fields like materials science, biology, and electronics.