X-ray photoelectron spectroscopy

X-ray photoelectron spectroscopy (XPS) is an analytical technique used to determine the surface composition of materials. It works by exposing a sample to X-rays, which eject electrons from the atoms on its surface. By measuring the energy of these electrons, scientists can identify the elements present and their chemical states. This method provides detailed information about the surface's elemental makeup and chemical environment, making it valuable in materials science, chemistry, and surface engineering for understanding material properties and detecting contaminants.