transmission electron microscopy (TEM)

Transmission Electron Microscopy (TEM) is a powerful imaging technique that uses electrons instead of light to examine tiny structures at very high resolutions. In TEM, a thin sample is placed in the path of an electron beam, which passes through the sample and is captured on a detector. This allows scientists to visualize the internal composition and arrangement of materials at the atomic level. TEM is widely used in fields like materials science, biology, and nanotechnology to study the details of cells, metals, and other materials, providing insights that help advance research and development.