Secondary ion mass spectrometry (SIMS)

Secondary Ion Mass Spectrometry (SIMS) is a sophisticated analytical technique used to analyze the composition of solid materials at very small scales. It works by bombarding a sample with a focused beam of ions, which causes some of the sample's atoms to be ejected as secondary ions. These ions are then collected and analyzed to identify their elemental or molecular composition. SIMS is widely used in fields like materials science, geology, and semiconductor research, providing detailed insights into surface layers, thin films, and complex materials, thus helping scientists understand the structure and properties of different substances.