SIMS analysis

SIMS (Secondary Ion Mass Spectrometry) is an analytical technique used to analyze the composition of a material's surface. It works by bombarding a sample with a focused primary ion beam, which sputters off tiny particles from the surface. These ejected particles, called secondary ions, are then collected and analyzed based on their mass. This process provides detailed, localized information about the sample's elemental and isotopic makeup, allowing scientists to understand its composition at microscopic scales. SIMS is widely used in materials science, geochemistry, and semiconductor research for precise surface analysis.