Near-field Scanning Optical Microscopy

Near-field Scanning Optical Microscopy (NSOM) is a sophisticated imaging technique that allows scientists to observe tiny details at the nanoscale, beyond the limits of traditional optical microscopes. It uses a sharp probe, much smaller than the wavelength of light, to scan very close to a sample's surface. By detecting light interactions at this near-field level, NSOM provides high-resolution images and analyses of materials, enabling researchers to study structures and properties at a scale that is critical in fields like nanotechnology, materials science, and biology. This technique enhances our understanding of complex systems at microscopic levels.