Tof-SIMS

TOF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) is an analytical technique used to examine the surface composition of materials. It works by firing a focused beam of ions onto a sample, causing the surface to eject tiny particles called secondary ions. These ions are then measured based on how long they take to reach a detector—their "flight time." Because different atoms and molecules have unique masses, TOF-SIMS can identify and map the distribution of elements and compounds on surfaces with high sensitivity and spatial resolution, making it valuable in fields like materials science, electronics, and forensics.