Ion Beam Analysis

Ion Beam Analysis (IBA) is a technique used to examine the structure and composition of materials by directing a focused beam of ions—charged particles—at a sample. When these ions collide with atoms in the material, they produce signals—like energized particles or light—that reveal information about the types and amounts of elements present, as well as their arrangements. IBA is precise and non-destructive, making it valuable in fields like materials science, archaeology, and electronics for analyzing thin layers, coatings, or complex structures without damaging the sample.