High-Resolution X-ray Diffraction

High-Resolution X-ray Diffraction (HRXRD) is a technique used to analyze the structure of materials at an atomic level. It involves shining X-rays onto a sample, which are then scattered by the atoms within. By measuring how these X-rays diffract, or spread out, scientists can determine details like the arrangement, spacing, and quality of crystal layers. HRXRD provides highly precise information about the internal structure of thin films, coatings, and crystalline materials, helping researchers evaluate their properties for uses in electronics, optics, and materials science.