high-resolution force mapping

High-resolution force mapping is a technique used to measure and visualize the forces acting on a surface at a very detailed level. It employs specialized tools, like atomic force microscopes, to detect forces between microscopic probes and the surface being studied. This allows scientists to create detailed maps that show variations in strength, adhesion, and other properties across a material. Such detailed information can be crucial in fields like materials science, biology, and nanotechnology, helping researchers understand how materials behave and how they can be improved for various applications.