backscattered electron imaging

Backscattered electron imaging is a technique used in electron microscopy to visualize the surfaces of materials at a very small scale. When a beam of electrons hits a sample, some electrons bounce back; these backscattered electrons carry information about the material's composition and structure. By detecting these electrons, scientists can create detailed images that reveal variations in material properties, such as different phases or elements. This method is particularly useful in materials science, biology, and nanotechnology for analyzing complex structures and understanding how materials behave.