XPS Data Analysis

X-ray Photoelectron Spectroscopy (XPS) Data Analysis involves examining the energy levels of electrons ejected from a material’s surface when exposed to X-rays. By measuring these energy levels, scientists can identify the types of elements present and their chemical states, as well as estimate the surface composition within a few nanometers. The analysis includes deconvoluting complex spectra, correcting for background signals, and quantifying element concentrations. This process provides detailed insights into the surface chemistry and structure of materials, which is vital for research, quality control, and developing new materials in various scientific and industrial fields.