X-ray ptychography

X-ray ptychography is an advanced imaging technique that uses X-ray beams to capture detailed, high-resolution images of objects. It works by scanning a focused X-ray beam across the sample in overlapping areas, collecting diffraction patterns at each position. These patterns are then computationally reconstructed to produce a highly detailed, two- or three-dimensional image of the sample’s internal structure, often at nanometer-scale resolution. This method allows scientists to see fine details in materials, biological specimens, or electronic devices without damaging them, improving our understanding of complex structures in various scientific and industrial fields.