X-ray fluorescence spectroscopy

X-ray fluorescence (XRF) spectroscopy is an analytical technique used to determine the elemental composition of a material. When a sample is exposed to high-energy X-rays, its atoms absorb this energy, causing some electrons to eject from their orbits. As electrons from higher energy levels fall back into these vacancies, they emit secondary X-rays—called fluorescence—that are characteristic of specific elements. By measuring these emitted X-rays with a detector, scientists can identify and quantify the elements present in the sample quickly and non-destructively, making XRF valuable in fields like geology, archaeology, and material science.