wafer inspection

Wafer inspection is a crucial process in semiconductor manufacturing where tiny circuits on silicon wafers are examined for defects or irregularities. Using advanced imaging technologies, inspectors detect issues like scratches, particles, or pattern errors that could affect chip performance. This ensures only high-quality wafers move forward in production, improving device reliability and yield. The process involves automated equipment that scans the wafer surface at high resolution, allowing technicians to identify and address problems early, ultimately leading to better, more reliable electronic components.