two-dimensional X-ray diffraction

Two-dimensional X-ray diffraction (2D XRD) is a technique used to analyze the structure of materials at the atomic level. When X-rays are directed at a sample, they scatter in specific patterns depending on how atoms are arranged. In 2D XRD, the resulting diffraction pattern is captured on a flat detector, producing a two-dimensional image. This pattern reveals information about the material's crystalline structure, such as the size of its grains, orientation, and degree of order. It is widely used in materials science, chemistry, and physics to understand the internal arrangement of complex materials.