Structured Illumination Microscopy

Structured Illumination Microscopy (SIM) is an advanced imaging technique that enhances microscope resolution beyond traditional limits. It works by projecting a specific pattern of light onto a sample and capturing multiple images with different pattern orientations. These images are then computationally combined to reconstruct a highly detailed picture, revealing structures that are normally too small to see clearly. SIM allows scientists to observe biological specimens, like cells and tissues, with greater clarity and detail, improving our understanding of their intricate inner workings without damaging the samples.