SIMS Imaging

SIMS (Secondary Ion Mass Spectrometry) Imaging is a technique used to analyze the composition of a sample’s surface at a very fine scale. It works by scanning a focused primary ion beam across the sample, which ejects secondary ions from the surface. These ions are then collected and measured to determine the elements and molecules present, creating detailed images that reveal the distribution of materials at microscopic levels. SIMS imaging is valuable in fields like materials science, biology, and geology for understanding surface compositions with high spatial resolution and sensitivity.