SEM imaging

Scanning Electron Microscopy (SEM) is a technique that uses a focused beam of electrons to create highly detailed images of a sample's surface. When the electron beam hits the surface, it causes electrons and other signals to emit from the sample, which are then detected and translated into a detailed, three-dimensional image. SEM provides much higher resolution than regular light microscopes, allowing us to see tiny structures, textures, and features at the microscopic level—like seeing the surface roughness of a material or the minute details of biological tissues.