SEM/FIB Cross-Sectioning

SEM/FIB cross-sectioning combines two advanced techniques: Scanning Electron Microscopy (SEM) and Focused Ion Beam (FIB). The FIB uses a thin beam of ions to precisely cut or mill into a sample, creating a smooth cross-section. The SEM then images this exposed surface in high detail, revealing internal structures and layers. This method allows scientists to analyze the internal composition and features of materials or devices non-destructively and with nanometer precision, making it invaluable for fields like materials science, electronics, and failure analysis.