Scanning Tunneling Spectroscopy

Scanning Tunneling Spectroscopy (STS) is a technique used to study the electrical properties of materials at the atomic level. It involves a sharp probe that approaches a surface very closely, allowing electrons to "tunnel" between the probe and the surface. By measuring the tunneling current as the probe scans over the material, researchers can gather information about the surface's electronic structure and properties. This technique provides valuable insights into superconductors, semiconductors, and other materials, helping scientists understand their behavior and performance in various applications.