Scanning Interferometric Microscopy

Scanning Interferometric Microscopy is a technique that uses light interference to create detailed, three-dimensional images of a surface. It works by directing coherent light, such as from a laser, onto the object and measuring the way the light waves interact with the surface features. As the probe scans across the sample, the device captures subtle height differences down to very small scales, enabling precise topographical mapping. This method combines the principles of interference and scanning to provide high-resolution, non-contact measurements of surface structures, making it valuable for materials science, biology, and engineering applications.